Open Access
Circuit Breaker Patterns for Fault-Tolerant Systems
Sarah O'Connor
1
,
Kenji Nakamura
2
,
David Miller
3
,
Kenji Nakamura
2
,
David Miller
3
1
Trinity College Dublin, Ireland
2
Kyoto University, Japan
3
Stanford University, USA
Abstract
This comprehensive review examines the current state and future prospects of this research area. We analyze over 169 studies published in recent years, covering applications in various domains. The review identifies key technological advancements, validation challenges, and regulatory considerations. Our analysis reveals significant progress in the field.
Keywords
computer vision,image processing,object detection,CNNs,pattern recognition
How to Cite
O’Connor, S., Nakamura, K., & Miller, D. (2022). Circuit Breaker Patterns for Fault-Tolerant Systems. Nivo Light - International Journal of Research & Innovation, 4(4), 14–21. https://doi.org/10.28051/ojstest-143
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